JEOL 5310-LV Scanning electron microscope

Main features

• working at low presure
• backscattered electron detector
• low vacuum secondary electron detector
• mechanical testing holder available

Basic technical parameters

• magnification – 35x - 200,000x
• accelerating voltage – 0.5 kV to 30 kV
• specimen stage – manual control, x-y:38 mm x 70 mm, tilt:-10° to ～＋70°, rotation:360°, working distance: 8 mm to 48 mm, specimen size: diameter 72 mm (max), height 40 mm (max)