Institute of materials and machine mechanics
Slovak Academy of sciences
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Advanced materials
Lightweight materials
Al matrix composite with boron fibres
Extruded Al/SiC composites
Metal foam in space application
Carbon fiber reinforced magnesium composite
High-temperature materials
Slicide matrix composites
NiAl matrix composites
Advanced technologies
Manufacturing of metal matrix composites
Pressure assisted liquid metal infiltration
Vacuum diffusion bonding
Coating techniques
Fibre coating
Physical vapor deposition
Advanced studies
PhD study
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Material structure characterization
Chemical composition analysis including gas content analysis
Phase analysis
Microstructure analysis
Defect analysis (inclusions, impurities, pores, cracks)
Destructive and nondestructive testing of materials
Physical properties measurement
Thermal analysis
Casting and heat treatment
Simulations and modeling
Stress simulation
Simulation of interaction trajectories between
incident electron beam and specimen
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FEI Themis ETEM - FEG Scanning Transmission Electron Microscope
Location:
Institute headquarters
, Bratislava
Main features
operates in TEM and STEM mode
atomic resolution combined with high analytical capabilities
multi-signal detection from up to four signal simultaneously to accelerate scanning transmission electron microscopy (S/TEM) imaging
Cs Probe Correctorfor sub-A resolution in STEM mode
super X: High-sensitivity, windowless EDX detector system based on SDD technology
electron energy loss spectroscopy (EELS)
field-free imaging in Lorentz mode with 2nm resolution for magnetic property studies
micro-tomography
cryo-electron microscopy
Basic technical parameters
accelerating voltage (X-FEG) – (80, 200, 300) kV
resolution: 200 kV performance - TEM information limit ≤ 0.8 Å; HR-STEM resolution ≤ 0.8;
EDX: output count rate up to 200 Kcps120 mm
2
combined detector area, detection of all elements down to boron
holders: single tilt holder
double tilt holder
cryo holder
detectors: TEM - CMOS based FEI CETA camera; STEM- HAADF, BF, DF2, DF4; EDX – Super X windowless EDX; EELS – Enfiniumspektrometer
Contact
Štefan Nagy