JEOL 5310-LV Scanning electron microscope


Location: Institute headquarters, Bratislava

Main features

  • working at low presure
  • backscattered electron detector
  • low vacuum secondary electron detector
  • mechanical testing holder available

Basic technical parameters

  • magnification – 35x - 200,000x
  • accelerating voltage – 0.5 kV to 30 kV
  • specimen stage – manual control, x-y:38 mm x 70 mm, tilt:-10° to ~+70°, rotation:360°, working distance: 8 mm to 48 mm, specimen size: diameter 72 mm (max), height 40 mm (max)

JEOL 5310

Contact

Štefan Nagy
Ľubomír Orovčík