Institute of materials and machine mechanics
Slovak Academy of sciences
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Advanced materials
Lightweight materials
Al matrix composite with boron fibres
Extruded Al/SiC composites
Metal foam in space application
Carbon fiber reinforced magnesium composite
High-temperature materials
Slicide matrix composites
NiAl matrix composites
Advanced technologies
Manufacturing of metal matrix composites
Pressure assisted liquid metal infiltration
Vacuum diffusion bonding
Coating techniques
Fibre coating
Physical vapor deposition
Advanced studies
PhD study
Services
Material structure characterization
Chemical composition analysis including gas content analysis
Phase analysis
Microstructure analysis
Defect analysis (inclusions, impurities, pores, cracks)
Destructive and nondestructive testing of materials
Physical properties measurement
Thermal analysis
Casting and heat treatment
Simulations and modeling
Stress simulation
Simulation of interaction trajectories between
incident electron beam and specimen
Research data
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JEOL 5310-LV Scanning electron microscope
Location:
Institute headquarters
, Bratislava
Main features
working at low presure
backscattered electron detector
low vacuum secondary electron detector
mechanical testing holder available
Basic technical parameters
magnification – 35x - 200,000x
accelerating voltage – 0.5 kV to 30 kV
specimen stage – manual control, x-y:38 mm x 70 mm, tilt:-10° to ~+70°, rotation:360°, working distance: 8 mm to 48 mm, specimen size: diameter 72 mm (max), height 40 mm (max)
Contact
Štefan Nagy
Ľubomír Orovčík